Transistor FET Power Supply Tester
Long-term monitoring running test device for conducting power-on tests of transistors and FETs (capable of temperature stress response).
The Model 6300A is a semiconductor device running test equipment that records the electrical characteristics of FETs and transistors for extended periods under burn-in test conditions. The detection resistance can be replaced according to the characteristics of the FETs and transistors. *Product specifications are subject to change without notice. Thank you for your understanding.*
